08-13-2021, 08:29 AM
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#617
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Senior Member
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Fractional Pixel Method for Improved Pixel-Level Measurement and Correction of High-Res Displays
As display resolution and pixel density increase, measuring the characteristics (luminance, chromaticity) of individual display pixels becomes more difficult for current imaging technology. Single-image analysis is important for optimizing efficiency for viable production processes. Imaging systems must continue to accurately measure
the increasing number of pixels in a display at once, applying increasingly limited relative imaging resolution. A method of display pixel registration and measurement using fractional image sensor pixels improves the accuracy of pixel-level luminance values obtained in single-image measurements for effective qualification and demura of emissive (OLED, mini/microLED) displays.
Doug Kreysar, CEO at Radiant Vision Systems, leads this webinar introducing Radiant's fractional pixel measurement method, which ensures the effectiveness of image-based display test systems as displays increase in resolution. The webinar includes a description of the method and a study of its accuracy as compared to traditional methods.
In this webinar you will learn about:
- The need for correction in emissive displays (OLED, miniLED, microLED)
- The impact of display resolution on pixel-level measurement accuracy
- Traditional "whole pixel" methods for pixel-level display measurement and correction
- Radiant's fractional pixel measurement method and accuracy study
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Improving MicroLED Display Quality Using Radiant’s Pixel-Level Measurement and Correction
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Display Week 2021 - Exhibitor Forum: Measuring MicroLEDs for Pixel Uniformity Correction
Measuring the luminance and color of every microLED in a display is challenging for current measurement systems. Single-image display analysis is critical for speed and production throughput, but limits imaging resolution per display pixel. Learn about methods that boost imaging performance for pixel-level measurement, ensuring effective microLED uniformity correction (demura). Watch this exhibitor presentation from Radiant Vision Systems to learn about our measurement systems and methods.
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Display Week 2021 - Short Course: Fundamentals of Display Metrology
With so much of a device’s value in its display, investment in display development and manufacturing is high, and accuracy and efficiency are critical. Display metrology provides an objective understanding of a display’s quality and performance through data, supplying tools for innovation and evaluation to safeguard manufacturing investment. Display metrology employs scientific methods and equipment to capture and assess quantitative values of a display’s output such as luminance, color, uniformity, and contrast. Display test systems range in their function, application, and unique advantages, and are rapidly evolving to address measurement for never-before-seen display types, shapes, and integrations. This short course will provide a fundamental understanding of display metrology and introduce measurement equipment and techniques from leaders in the field. Topics include the science of light and color, units of measurement, measurement standards, metrology systems from spot meters to imaging equipment, test methods to address display performance parameters from mura to pixel uniformity to flicker, and the latest metrology solutions for testing emerging displays from microLED to AR/VR devices.
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